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Thermal characteristics evaluation for board-level high performance flip-chip package equipped with vapor chamber as heat spreader

机译:配备蒸气室作为散热器的板级高性能倒装芯片封装的热特性评估

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摘要

Thermal analysis was performed in this work to compare the thermal performance of a board-level high performance flip-chip ball grid array package equipped with solid Cu or vapor chamber (VC) as the heat spreader and Al-filler gel or In solder as the thermal interface material (TIM). The effect of different heat source sizes was also examined. Numerical results indicate that for the particular test vehicle under a power dissipation of 160W, the thermal performance is remarkably enhanced by switching TIM from Al-filler gel to In solder while the enhancement by using VC instead of solid Cu heat spreader is only observable when In solder is incorporated. Moreover, the performance of VC gradually enhances then retards as the heat source size decreases. The retardation can be attributed to the more dominant role of die in heat dissipation when the heat source size gradually shrinks.
机译:在这项工作中进行了热分析,以比较配备了固态铜或蒸气室(VC)作为散热器和铝填充胶或In焊料作为板级的板级高性能倒装芯片球栅阵列封装的热性能。热界面材料(TIM)。还检查了不同热源尺寸的影响。数值结果表明,对于功耗为160W的特定测试车辆,通过将TIM从铝填充胶切换为In焊料,可显着提高热性能,而仅使用In可以观察到使用VC代替固态Cu散热器的增强焊料被合并。而且,随着热源尺寸的减小,VC的性能逐渐增强,然后逐渐下降。当热源尺寸逐渐缩小时,延迟可归因于芯片在散热中的主导作用。

著录项

  • 来源
    《Microelectronic Engineering》 |2010年第12期|P.2463-2467|共5页
  • 作者单位

    Central Product Solutions, Advanced Semiconductor Engineering. Inc.. 26 Chin 3rd Rd.. Nantze Export Processing Zone. Kaoshiung 811, Taiwan;

    rnCentral Product Solutions, Advanced Semiconductor Engineering. Inc.. 26 Chin 3rd Rd.. Nantze Export Processing Zone. Kaoshiung 811, Taiwan;

    rnCentral Product Solutions, Advanced Semiconductor Engineering. Inc.. 26 Chin 3rd Rd.. Nantze Export Processing Zone. Kaoshiung 811, Taiwan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    thermal analysis; vapor chamber; flip-chip; thermal interface material;

    机译:热分析;蒸气室倒装芯片热界面材料;

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