机译:用原子力显微镜(AFM)研究稀的过氧化氨混合物(APM)中的硅表面与其组分之间的相互作用
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721, USA;
Department of Mining and Geological Engineering, University of Arizona, Tucson, AZ 85721, USA;
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721, USA;
Intel Corporation, Rio Rancho, NM 87124, USA;
Department of Materials Science and Engineering, University of Arizona, Tucson, AZ 85721, USA;
wafer cleaning; ammonia-hydrogen peroxide (APM); mixtures; interaction forces; contact angle measurements and atomic; force microscopy (AFM);
机译:原子力显微镜(AFM)分析聚合物聚集体与基材表面之间的范德华相互作用
机译:新型美学纤维增强聚合物复合树脂弓丝:比较原子力显微镜(AFM)和场发射扫描电子显微镜(FESEM)的研究
机译:HA钛表面的原子力显微镜研究
机译:在NIST上用校准的AFM研究硅阶梯表面作为原子力显微镜校准标准
机译:通过表面化学研究优化用于大批量生产的过氧化氨水混合物(APM)。
机译:新型美学纤维增强聚合物复合树脂弓丝:比较原子力显微镜(AFM)和场发射扫描电子显微镜(FESEM)的研究
机译:新型美学纤维增强聚合物复合树脂弓丝:比较原子力显微镜(AFM)和场发射扫描电子显微镜(FESEM)的研究