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Liquid phase silylation of a bilayer resist system

机译:双层光刻胶系统的液相甲硅烷基化

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摘要

0.35 μm packed and 0.20 μm isolated features have been printed with a positive acting top-surface imaging process. The process consists of a bilayer resist scheme, the top layer of which is a chemically amplified negative resist. The latter, after exposure and post-exposure bake, is silylated in the liquid phase and the latent positive images are resolved using an oxygen plasma etch.
机译:0.35微米堆积和0.20微米隔离特征已通过正作用顶面成像过程印刷。该工艺由双层抗蚀剂方案组成,其顶层是化学放大的负性抗蚀剂。在曝光和曝光后烘烤之后,后者在液相中被甲硅烷基化,并且潜在的正像使用氧等离子体蚀刻来分辨。

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