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Continuation-Based Pull-In and Lift-Off Simulation Algorithms for Microelectromechanical Devices

机译:基于连续性的微机电装置拉入和提离仿真算法

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The voltages at which microelectromechanical actuators and sensors become unstable, known as pull-in and lift-off voltages, are critical parameters in microelectromechanical systems (MEMS) design. The state-of-the-art MEMS simulators compute these parameters by simply sweeping the voltage, leading to either excessively large computational cost or to convergence failure near the pull-in or lift-off points. This paper proposes to simulate the behavior at pull-in and lift-off employing two continuation-based algorithms. The first algorithm appropriately adapts standard continuation methods, providing a complete set of static solutions. The second algorithm uses continuation to trace two kinds of curves and generates the sweep-up or sweep-down curves, which can provide more intuition for MEMS designers. The algorithms presented in this paper are robust and suitable for general-purpose industrial MEMS designs. Our algorithms have been implemented in a commercial MEMS/integrated circuits codesign tool, and their effectiveness is validated by comparisons against measurement data and the commercial finite-element/boundary-element (FEM/BEM) solver CoventorWare. $hfill[{2013hbox{-}0186}]$
机译:微机电致动器和传感器变得不稳定的电压(称为引入电压和提离电压)是微机电系统(MEMS)设计中的关键参数。最新的MEMS仿真器通过简单地扫描电压来计算这些参数,从而导致过大的计算成本或在拉入点或提离点附近收敛失败。本文提出使用两种基于连续的算法来模拟拉入和提离时的行为。第一种算法适当地适应了标准延续方法,提供了完整的静态解集。第二种算法使用连续性来跟踪两种曲线并生成上扫或下扫曲线,这可以为MEMS设计人员提供更多的直觉。本文提出的算法是健壮的,适用于通用工业MEMS设计。我们的算法已在商用MEMS /集成电路代码签名工具中实现,并且通过与测量数据和商用有限元/边界元(FEM / BEM)求解器CoventorWare进行比较来验证其有效性。 $ hfill [{2013hbox {-} 0186}] $

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