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CMOS-MEMS Micro-Mirror Arrays by Post-Processing ASMC 0.35- $mu text{m}$ CMOS Chips

机译:通过对ASMC 0.35- $ mu text {m} $ CMOS芯片进行后处理的CMOS-MEMS微镜阵列

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An electrostatic bi-stable 4 × 4 micro-mirror array is implemented by using the standard Advanced Semiconductor Manufacturing Corporation 0.35-μm 2-Poly-3-Metal fabless complementary metal-oxide-semiconductor microelectromechanical systems (CMOS-MEMS) process. Mechanical structures, including mirrors (18 μm×18 μm in area each), electrostatic actuation mechanisms, and the suspensions, are made in the top three metal layers. Typical static pull-in voltage is tested to be 49 V and the maximum tilt angle is estimated to be 14.6°. The micro mirror can be operated at frequencies upward of 11 kHz at least. Total lifetime of more than 134.5 h, 4.8 × 109 cycles, is tested. To avoid stiction during the process, the micro-mirror array is sacrificial-released from the substrate after the CMOS process by using reactive ion etching (RIE) and photoresist-assisted wet etching. Micro-mirror-wise processing yield of 99.3% after the release implies the robustness of the developed CMOS-MEMS process.
机译:静电双稳态4×4微镜阵列是通过使用标准的Advanced Semiconductor Manufacturing Corporation0.35-μm2-Poly-3Metal无晶圆厂互补金属氧化物半导体微机电系统(CMOS-MEMS)工艺实现的。机械结构包括镜子(每个镜子的面积为18μm×18μm),静电致动机构和悬架在最上面的三个金属层中制成。经测试,典型的静态吸合电压为49 V,最大倾斜角估计为14.6°。微型镜至少可以以11 kHz以上的频率工作。测试了总寿命超过134.5小时(4.8×10 9 个循环)。为避免在此过程中产生粘连,在CMOS工艺之后,通过使用反应离子刻蚀(RIE)和光刻胶辅助的湿法刻蚀将微镜阵列从基板上释放出来。发布后的微镜方式处理产率为99.3%,暗示了已开发的CMOS-MEMS工艺的坚固性。

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