A prestigious German institute is collaborating with a leading U.S. metrology tool vendor to provide advanced commercial testing services. The Institut Fresenius in Taunusstein has signed a three-year technology agreement with Solid State Measurements (SSM) of Pittsburgh to use SSM's Model 2000 spreading resistance profiler metrology tool. The institute will install the system in its Dresden measurement laboratory for use in testing and training. The tool uses a dual probe to measure ultrashal-low junctions to a depth resolution of 1 nm. The German government and the state government of Saxony both provided funds for the project.
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机译：一家著名的德国研究所正在与一家领先的美国计量工具供应商合作，以提供先进的商业测试服务。陶努斯斯坦的Fresenius研究所已与匹兹堡的Solid State Measurements（SSM）签署了一项为期三年的技术协议，以使用SSM的2000型扩散电阻廓线仪计量工具。该研究所将在其德累斯顿测量实验室中安装该系统，以用于测试和培训。该工具使用双探头测量超低速低结，深度分辨率为1 nm。德国政府和萨克森州政府都为该项目提供了资金。
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