The Linnik tomographic (sectional X-ray diffraction analysis) microscope for measurement of the spatial dis- tribution of the index of refraction within optically transparent (phase) objects is described. The microscope is constructed on the base of the MII-4 microinterferometer with a laser lighting source and constitutes a fully automated integrated system that incorporates a CCD camera, frame grabber, a computer-controlled PZT mirror, and a two-coordinate micrometer stage. The measurement system and performance characteristics of the microscope are presented.
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