THE SPECKLE INTERFEROMETRY METHOD FOR DETERMINING THE THERMAL EXPANSION OF NANOMATERIALS

摘要

A speckle interferometry method for the non-contact determination of the thermal expansion of nanomaterials with a rough surface is considered. Relations are derived for calculating the fundamental parameters of the speckle interferometer optical-electronic system, based on the Michelson interferometer arrangement. The results of an experiment to determine the thermal expansion of a sample are presented.