MEASURING THE SPEED OF DATA EXCHANGE IN MEMORY CARDS USING PROGRAMMABLE LOGIC INTEGRATED CIRCUITS

E. V. Kostikova; S. A. Seliverstov; Ya. A. Seliverstov; Sh. S. Fahmi

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MEASURING THE SPEED OF DATA EXCHANGE IN MEMORY CARDS USING PROGRAMMABLE LOGIC INTEGRATED CIRCUITS

机译：使用可编程逻辑集成电路测量存储卡中的数据交换速度

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摘要

A complex-functional unit has been developed for measuring the speed of writing (reading) SD cards based on the "system on chip" technology. It is shown that using this block it is possible to exchange data between a computer and memory cards both sequentially and in parallel. We present a method for determining the speed of information transfer between external drives and the processor core of systems on a chip. We obtain results for measuring the speed of writing (reading) of various memory cards. Confidence intervals of measurements are determined.

机译：已经开发了一种复杂功能单元，用于测量基于“芯片系统”技术的写作（读取）SD卡的速度。结果表明，使用该块可以在计算机和存储卡之间顺序和并行交换数据。我们介绍了一种用于确定芯片上系统之间的信息传递速度和系统的处理器内核的方法。我们获得了测量各种存储卡的写作速度（读取）的结果。确定测量的置信区间。

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来源
《Measurement techniques》 |2019年第1期|23-30|共8页
作者
E. V. Kostikova; S. A. Seliverstov; Ya. A. Seliverstov; Sh. S. Fahmi;
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作者单位

Makarov State University of Maritime and River Fleet St. Petersburg Russia;

Solomenko Institute of Transport Problems Russian Academy of Sciences St. Petersburg Russia;

Solomenko Institute of Transport Problems Russian Academy of Sciences St. Petersburg Russia;

Solomenko Institute of Transport Problems Russian Academy of Sciences St. Petersburg Russia St. Petersburg State Electrical Engineering University (LETI) St. Petersburg Russia Research Institute of Television St. Petersburg Russia;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
原文格式 PDF
正文语种 eng
中图分类
关键词
SD card; performance; system on a chip; complex-functional unit;

机译：SD卡;表现;芯片上的系统;复杂功能单位;
入库时间 2022-08-18 21:12:27

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专利

1. A high-speed functional memory with a capability of hamming-distance-slective data search using threshold logic circuits [J] . Hiroaki Yamaoka, Makoto Ikeda, Kunihiro Asada 電子情報通信学会技術研究報告. VLSI設計技術. VLSI Design Technologies . 2002,第683期

机译：具有使用阈值逻辑电路进行汉明距离选择数据搜索功能的高速功能存储器
2. A high-speed functional memory with a capability of hamming-distance-slective data search using threshold logic circuits [J] . Hiroaki Yamaoka, Makoto Ikeda, Kunihiro Asada 電子情報通信学会技術研究報告. 集積回路. Integrated Circuits and Devices . 2002,第685期

机译：具有使用阈值逻辑电路进行汉明距离选择数据搜索功能的高速功能存储器
3. A high-speed functional memory with a capability of hamming-distance-slective data search using threshold logic circuits [J] . Hiroaki Yamaoka, Makoto Ikeda, Kunihiro Asada 電子情報通信学会技術研究報告. VLSI設計技術. VLSI Design Technologies . 2002,第683期

机译：使用阈值逻辑电路，具有汉明远程数据搜索的能力的高速功能存储器
4. Design of power optimized memory circuit using High Speed Transreceiver Logic IO Standard on 28nm Field Programmable Gate Array [C] . Sweety, Pandey Bishwajeet, Kumar Tanesh, 2014 International Conference on Optimization, Reliabilty, and Information Technology . 2014

机译：使用高速收发器逻辑IO标准在28nm现场可编程门阵列上设计功耗优化的存储电路
5. Graphene nanotechnology for the next generation logic, memory, and 3D integrated circuits. [D] . Hossain, Md Nahid. 2016

机译：石墨烯纳米技术用于下一代逻辑，存储器和3D集成电路。
6. Integrated logic circuits using single-atom transistors [O] . J. A. Mol, J. Verduijn, R. D. Levine, 2011

机译：使用单原子晶体管的集成逻辑电路
7. Correction to: “Measuring the Speed of Data Exchange in Memory Cards Using Programmable Logic Integrated Circuits” [O] . E. V. Kostikova, S. A. Seliverstov, Ya. A. Seliverstov, 2020

机译：校正：“使用可编程逻辑集成电路测量存储卡中的数据交换速度”
8. Production Engineering Measures (Pem) for Microelectronic Circuitry and Milliwatt Logic Semiconductor Integrated Circuits [R] . Brooks, D. W., Stein, A. J. 1965

机译：微电子电路和milliwatt逻辑半导体集成电路的生产工程措施（pem）

MEASURING THE SPEED OF DATA EXCHANGE IN MEMORY CARDS USING PROGRAMMABLE LOGIC INTEGRATED CIRCUITS

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