...
首页> 外文期刊>Mathematical Problems in Engineering >Noise Estimation for Single-Slice Sinogram of Low-Dose X-Ray Computed Tomography Using Homogenous Patch
【24h】

Noise Estimation for Single-Slice Sinogram of Low-Dose X-Ray Computed Tomography Using Homogenous Patch

机译:低剂量X射线计算机断层扫描的均匀切片的单层汉字噪声估计。

获取原文
获取原文并翻译 | 示例

摘要

We present a new method to estimate noise for a single-slice sinogram of low-dose CT based on the homogenous patches centered at a special pixel, called center point, which has the smallest variance among all sinogram pixels. The homogenous patch, composed by homogenous points, is formed by the points similar to the center point using similarity sorting, similarity decreasing searching, and variance analysis in a very large neighborhood (VLN) to avoid manual selection of parameter for similarity measures.Homogenous pixels in the VLN allow us find the largest number of samples, who have the highest similarities to the center point, for noise estimation, and the noise level can be estimated according to unbiased estimation. Experimental results show that for the simulated noisy sinograms, the method proposed in this paper can obtain satisfied noise estimation results, especially for sinograms with relatively serious noises.
机译:我们提出了一种新方法,该方法基于以特殊像素(称为中心点)为中心的均质斑块来估计低剂量CT单层正弦图的噪声,该像素在所有正弦图像素中具有最小的方差。由均质点组成的均质斑块是通过在非常大的邻域(VLN)中使用相似性排序,相似性降低搜索和方差分析,通过与中心点相似的点形成的,以避免为相似性度量手动选择参数。在VLN中,我们可以找到与中心点相似度最高的最大样本数,以进行噪声估计,并且可以根据无偏估计来估计噪声水平。实验结果表明,对于模拟的噪声正弦图,本文提出的方法可以获得满意的噪声估计结果,特别是对于噪声比较严重的正弦图。

著录项

  • 来源
    《Mathematical Problems in Engineering》 |2012年第1期|p.363-378|共16页
  • 作者单位

    Visual Computing and Virtual Reality Key Laboratory Of Sichuan Province,Sichuan Normal University, Chengdu 610101, China;

    School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu 610054, China;

    School of Information Science & Technology, East China Normal University, no. 500,Dong-Chuan Road, Shanghai 200241, China;

    School of Automation Engineering, University of Electronic Science and Technology of China,Chengdu 610054, China;

  • 收录信息
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号