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A New Software Reliability Growth Model: Multigeneration Faults and a Power-Law Testing-Effort Function

机译:一种新的软件可靠性增长模型:多代故障和幂律测试-努力功能

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摘要

Software reliability growth models (SRGMs) based on a nonhomogeneous Poisson process (NHPP) are widely used to describe the stochastic failure behavior and assess the reliability of software systems. For these models, the testing-effort effect and the fault interdependency play significant roles. Considering a power-law function of testing effort and the interdependency of multigeneration faults, we propose a modified SRGM to reconsider the reliability of open source software (OSS) systems and then to validate the model's performance using several real-world data. Our empirical experiments show that the model well fits the failure data and presents a high-level prediction capability. We also formally examine the optimal policy of software release, considering both the testing cost and the reliability requirement. By conducting sensitivity analysis, we find that if the testing-effort effect or the fault interdependency was ignored, the best time to release software would be seriously delayed and more resources would be misplaced in testing the software.
机译:基于非均匀泊松过程(NHPP)的软件可靠性增长模型(SRGM)被广泛用于描述随机故障行为并评估软件系统的可靠性。对于这些模型,测试努力效果和故障相互依赖性起着重要作用。考虑到测试工作的幂律功能和多代故障的相互依赖性,我们提出了一种改进的SRGM,以重新考虑开源软件(OSS)系统的可靠性,然后使用一些实际数据来验证模型的性能。我们的经验实验表明,该模型很好地拟合了故障数据,并具有较高的预测能力。我们还将考虑测试成本和可靠性要求,正式检查软件发行的最佳策略。通过进行敏感性分析,我们发现,如果忽略测试努力效果或故障相互依赖性,则会严重延迟发布软件的最佳时间,并且会浪费更多的资源来测试软件。

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  • 来源
    《Mathematical Problems in Engineering》 |2016年第11期|9276093.1-9276093.13|共13页
  • 作者

    Li Fan; Yi Ze-Long;

  • 作者单位

    Shenzhen Univ, China Ctr Special Econ Zone Res, Nanhai Ave 3688, Shenzhen 518060, Guangdong, Peoples R China;

    Shenzhen Univ, Coll Econ, Dept Transportat Econ & Logist Management, Nanhai Ave 3688, Shenzhen 518060, Guangdong, Peoples R China;

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