X-ray diffraction topography observations of the core in Bi_(12)SiO_(20) crystals doped with Mn

摘要

The core region in a bismuth silicate―Bi_(12)SiO_(20) (BSO) crystal doped with Mn was examined by X-ray double-crystal diffraction topography. Specific features were observed in the topographies as lines and contrast differences that point to defects occupying the central part of the crystal. We discuss the nature of these defects and propose an explanation in terms of stacking faults arranged in different structures.