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CHEMICAL VAPOR DEPOSITION OF HEXAGONAL BORON NITRIDE FILMS IN THE REDUCED PRESSURE

机译:减压下六方氮化硼薄膜的化学气相沉积

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Hexagonal boron nitride (h-BN) films were deposited onto a graphite substrate in reduced pressure by reacting ammonia and boron tribromide at 800- l200 C. The growth rate of h-BN films was dependent on the substrate temperature and the total pressures. The growth rate increased with increasing the substrate temperature at the pressure of 2 kPa, while it showed a maximum value at the pressures of 4 and 8 kPa. The temperature at which the maximum growth rate occurs decreased with increasing total pressure. With increasing the substrate temperature and total pressure, the apparent grain size increased and the surface morphology showed a rough, cauliflower-like structure.
机译:通过使氨和三溴化硼在800-1200 C下反应,将六边形氮化硼(h-BN)膜减压沉积到石墨衬底上。h-BN膜的生长速率取决于衬底温度和总压力。在2 kPa的压力下,随着衬底温度的升高,生长速率增加,而在4 kPa和8 kPa的压力下,生长速率显示出最大值。随着总压力的增加,出现最大增长率的温度降低。随着基材温度和总压力的增加,表观晶粒尺寸增加,表面形态显示出粗糙的花椰菜状结构。

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