PHASE CHANGE OPTICAL RECORDING FILMS BASED ON Bi_2Te_3-Sb_2Te_3 ALLOYS

摘要

Thin films from cross section Bi_2Te_3-Sb_2Te_3 were studied in view of glass- crystal reversible phase change recording by using laser diode irradiation. By adjusting the spherical aberration of the focalization lens and using a Raman microprobe, reflectivity and vibrational profiles of the laser spot were per- formed in order to determine the most sensitive region of the illuminated area. The optical switch was then analyzed in optimized conditions over the whole cross section. When considering identical cycling parameters, the latter ap- pears to be inverted at a critical composition, which depends critically on the layer thickness.