A new method for the evaluation of stabilization index of polyacrylonitrile fibers

摘要

A new method for the evaluation of stabilization index (SI) using X-ray diffraction is described. The strongest diffraction peak from PAN fibers arises from the (100) plane whose intensity decreases gradually and markedly with the progress of stabilization, and complete stabilization results in the disappearance of the peak. The peak does not become superposed with others and its center hardly moves. This indicates that the SI can be characterized by intensity changes of the (100) peak. The feasibility of this was verified by elemental analysis and density measurements.