Atomic Force Microscope (afm) In Chemistry, Biology And material Science

摘要

The Atomic Force Microscope (AFM) was developed to overcome a basic drawback of Scanning Tunneling Microscope (STM) which is applicable to only conducting or semiconducting surfaces. As AFM does not require any electrically conducting surface, it has the advantage of exploring molecular details of almost any type of surface, including polymers, composites, crystals and biological materials. Now-a-days the AFM is being extensively used across various disciplines for investigating properties of nano-materials and newer techniques based on AFM with finer resolution is being developed.