Atomic Force Microscope(afm) In Chemistry, Biology And material Science

摘要

Since its invention about two decades ago, scanning probe microscopy (SPM) has extensively been used in various areas as diverse as material science, biology, chemistry and semiconductor physics. The reason for phenomenal and instantaneous success of SPM lies in its ability to provide three dimensional, real space surface images obtained as a response from local interaction between the probe and sample surface. In fact, the basic principle of SPM lies in detecting local response of the sample for the interaction with the probe tip. A number of variants of SPM have been developed based on the detections of different kinds of response arising from electronic, magnetic, van der Waals interactions.