Microstructure of 90 deg.C domains in ferroelectric materials studied by XRD

摘要

The purpose of this paper is to show how X-ray diffraction is a very useful tool for the characterization of ferroelectric domain microstructure in ferroelectric materials, such as BaTiO_3. A particularity of the XRD diagram is directly related to the domain microstructure, especially the density and the thickness of the 90 deg.c domain walls.