Electron Microscopy and Microanalysis of Advanced Ceramics

摘要

In order to successfully achieve microstructural tailoring of materials for desired properties, it is necessary to understand processing-structure-property linkages in great detail. This requires the characterization of advanced materials by sophisticated techniques, especially those of advanced electron microscopy, diffraction and microanalysis. Microstructurally, grain boundaries and interfaces play dominant roles in the performance of ceramics, but their characterization poses particularly difficult problems. However, progress in high resolution imaging and microanalytical techiiiques, especially energy loss spectroscopy, are proving to be essential to understand many problems, including defects introduced in processing. This paper summarizes examples from our tesearch dealing with refractory ceramics based on Si3N4`, including joinnig, and BN-coated SiC-fiber reinforced SiC composites.