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Bonding and Electronic Structure of XeF_3~-

机译:XeF_3〜-的键合与电子结构

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The xenon-fluoride bond dissociation energy in XeF_3~- has been measured by using energy-resolved collision-induced dissociation studies of the ion. The measured value, 0.84 ± 0.06 eV, is higher than that predicted by electrostatic and three-center, four-electron bonding models. The bonding in XeF_3~-is qualitatively described by using molecular orbital approaches, using either a diradical approach or orbital interaction models. Two low-energy singlet structures are identified for XeF_3~-, consisting of Y- and T-shaped geometries, and there is a higher energy D_(3h) triplet state. Electronic structure calculations predict the Y geometry to be the lowest energy structure, which can rearrange by pseudorotation through the T geometry. Orbital correlation diagrams indicate that that ion dissociates by first rearranging to the T structure before losing fluoride.
机译:XeF_3〜-中的氙气氟化物键离解能通过离子的能量分解碰撞诱导离解研究进行了测量。测量值0.84±0.06 eV,高于静电和三中心,四电子键合模型预测的值。通过分子轨道方法,双自由基方法或轨道相互作用模型定性地描述了XeF_3〜-中的键合。对于XeF_3〜-,确定了两个低能量单重态结构,它们由Y形和T形几何组成,并且具有较高的D_(3h)三重态。电子结构计算预测Y几何是最低能量的结构,可以通过T几何的伪旋转来重新排列。轨道相关图表明,在失去氟化物之前,离子首先通过重排为T结构而解离。

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