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Improved double acceptance sampling plan based on truncated life test for some popular statistical distributions

机译:改进的基于截短寿命测试的双重验收抽样方案,用于一些流行的统计分布

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摘要

In this paper, a modified double acceptance sampling plan for time-truncated life test is developed. The operating procedure of this plan is also proposed and the performance measures such as the probability of acceptance and the average sample number (ASN) are also derived. We consider gamma distribution, Weibull distribution and Birnbaum-Saunders distribution for designing the proposed plan. The optimal parameters are determined which will have minimum ASN. The efficiency of the proposed plan is also discussed over the traditional double sampling plan (DSP) and shown that the proposed plan performs better than the existing DSP. The extensive tables are provided for all the distributions and explained with the help of industrial data.
机译:本文提出了一种改进的双重截断抽样计划,用于时间截短的寿命测试。还提出了该计划的操作程序,并得出了性能指标,例如验收概率和平均样本数(ASN)。我们在设计拟议计划时考虑了伽马分布,威布尔分布和伯恩鲍姆·桑德斯分布。确定将具有最小ASN的最佳参数。与传统的双采样计划(DSP)相比,该计划的效率也得到了讨论,表明该计划的性能要优于现有的DSP。提供了适用于所有分布的扩展表,并在工业数据的帮助下进行了解释。

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