Electrostatic Discharge Test on the Cu (In, Ga) Se2 Solar Cell Array

摘要

The boundary part of dielectric material, conductive material, and space, known as the triple junction, causesnelectrostatic discharge. Because the triple junction does not exist on theCu (In,Ga) Se2 solar cell surface, it should benfree of electrostatic discharge. Electrostatic discharge tests onCu (In,Ga) Se2 were performed in a vacuumchambernwhich simulated the plasma environment in low Earth orbit and the high-energy electron environment inngeostationary orbit. Contrary to the theoretical expectations, electrostatic discharge occurred on the surface of Cun(In, Ga) Se2 and Cu (In, Ga) Se2 suffered degradation of electric performance. The arc track was investigated tonmake clear the degradation mechanism of Cu (In, Ga) Se2. The arc track worked as a leak resistance because thenPN junction collapsed and the materials of front and back surfaces electroded adhere along the arc track.