Polyconductor Temperature Profile Probe

摘要

A sensitive rigid temperature probe incorporating solid state polyconductor devices was designed and constructed to measure distributed temperatures in hard to reach areas, such as granular materials either in their natural state (e.g. earth) or stored locations (e.g. grain bins). Experimental results are presented for temperature profiles in stored wheat as well as in process wheat, during the heating stage in a microwave grain dryer, and confirm the advantages of the proposed probe.