Thickness invariant parameter retrieval techniques for permittivity and permeability measurement

摘要

The study investigates the use of scattering parameters measurement to retrieve the permittivity, permeability, refractive index and intrinsic impedance of materials over the wide range of frequencies. The approach is demonstrated for thin as well as thick materials to clarify the complex branching problems of the logarithm and sign ambiguities. The special requirement of simulation and measurement setup and their alternative solution are also suggested in this work. The paper aims to simplify and streamline the approach of parameter retrieval for any thickness of material. The approach is verified using CST Microwave studio simulation and results obtained are validated using rectangular waveguide measurement method.