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Numerical simulations of island formation in a coherent strained epitaxial thin film system

机译:相干应变外延薄膜系统中岛形成的数值模拟

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Three dimensional finite element computations are used to predict the formation of quantum dot arrays in a strained epitaxial thin film system. The film is idealized as an initially planar, isotropic elastic layer with isotropic surface energy, which is coherently bonded to an elastic, lattice mismatched substrate. A small, doubly sinusoidal variation in film thickness, intended to represent the dominant wavelength of surface roughness, is introduced to trigger island formation. The film continues to roughen due to strain induced surface diffusion and eventually breaks up into arrays of discrete islands. The conditions necessary for island formation are identified, and are shown to differ significantly from the conditions necessary for spontaneous roughening of a strained layer. A detailed parametric study is conducted to determine the influence of the properties of film and substrate, film thickness, and surface roughness on the resulting island morphologies. In particular, our simulations show that there exists a critical range of surface roughness wavelength which leads to the formation of perfectly periodic island arrays. Finally, our predictions are compared with existing experimental measurements.
机译:三维有限元计算用于预测应变外延薄膜系统中量子点阵列的形成。该薄膜理想化为具有各向同性表面能的初始平面,各向同性的弹性层,该层与弹性,晶格失配的基体粘结在一起。引入了膜厚度的一个很小的双正弦变化,以表示表面粗糙度的主要波长,从而触发了岛的形成。由于应变引起的表面扩散,薄膜继续变粗糙,并最终分解成离散的岛阵列。确定了岛形成所需的条件,并显示出与应变层的自然粗糙化所需的条件明显不同。进行了详细的参数研究,以确定薄膜和基材的特性,薄膜厚度和表面粗糙度对所得岛形的影响。特别地,我们的模拟表明存在表面粗糙度波长的临界范围,这导致形成完美的周期性岛状阵列。最后,将我们的预测与现有的实验测量结果进行比较。

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