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Influence of heat treatment on LiNbO_3 thin films prepared on Si(111) by the polymeric precursor method

机译:热处理对聚合物前驱体法在Si(111)上制备的LiNbO_3薄膜的影响

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摘要

The effects of heat-treatment temperature on LiNbO_3 thin films prepared by the polymeric precursor method were investigated. The precursor solution was deposited on Si(111) substrates by dip coating. X-ray diffraction and thermal analyses revealed that the crystallization process occurred at a low temperature (420 ℃) and led to films with no preferential orientation. High-temperature treatments promoted formation of the LiNb_3O_8 phase. Scanning electron microscopy, coupled with energy dispersive spectroscopy analyses, showed that the treatment temperature also affected the film microstructure. The surface texture—homogeneous, smooth, and pore-free at low temperature—turned into an “islandlike” microstructure for high-temperature treatments.
机译:研究了热处理温度对聚合物前驱体法制备的LiNbO_3薄膜的影响。通过浸涂将前体溶液沉积在Si(111)基板上。 X射线衍射和热分析表明,结晶过程在低温(420℃)下发生,导致薄膜没有优先取向。高温处理促进了LiNb_3O_8相的形成。扫描电子显微镜和能量色散光谱分析表明,处理温度也影响了薄膜的微观结构。低温下均匀,光滑且无孔的表面纹理变成用于高温处理的“岛状”微结构。

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