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Ultra Low-cost Adaptations of Electro-mechanical Impedance Technique for Structural Health Monitoring

机译:机电阻抗技术的超低成本改编,用于结构健康监测

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This article outlines new low-cost hardware set-ups as viable substitutes for conventionally employed cost-intensive impedance analyzers/LCR meters for implementation of the electro-mechanical impedance (EMI) technique for SHM/NDE. The proposed solutions warrant basic low-cost equipment, such as function generator and digital multimeter, which are commonly available in most laboratories. Unlike the case of impedance analyzers/LCR meters, only the absolute admittance (i.e., magnitude) is measured. A simple computational approach is outlined for effective utilization of the absolute admittance function for SHM after filtering the passive component. Comparison of results with LCR measurements shows that the measurement accuracy of the proposed set-up is fairly good, repeatability excellent, and the damage sensitivity comparable to that of the cost-intensive conventional hardware. The proposed adaptation is, therefore a suitable candidate for the widespread industrial applications of the EMI technique.
机译:本文概述了新的低成本硬件设置,它们可以替代常规使用的成本密集型阻抗分析仪/ LCR仪表,以实现SHM / NDE的机电阻抗(EMI)技术。所提出的解决方案保证了基本的低成本设备,例如函数发生器和数字万用表,这些设备在大多数实验室中都普遍可用。与阻抗分析仪/ LCR测量仪的情况不同,仅测量绝对导纳(即幅度)。概述了一种简单的计算方法,可在过滤无源分量之后有效利用SHM的绝对导纳函数。与LCR测量的结果比较表明,所建议装置的测量精度相当好,可重复性极好,并且其损坏灵敏度可与成本密集的常规硬件相媲美。因此,所提出的改编对于EMI技术的广泛工业应用是合适的候选者。

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