首页> 外文期刊>Journal of Flow Visualization and Image Processing >RECONSTRUCTION OF CURVED PARTICLE STREAK TRAJECTORIES
【24h】

RECONSTRUCTION OF CURVED PARTICLE STREAK TRAJECTORIES

机译:弯曲的颗粒条纹轨迹的重建

获取原文
获取原文并翻译 | 示例
           

摘要

We present a method for reconstructing curved particle trajectories from particle streak velocimetry. The reflection properties of a particle are modeled as a point light source. The mapping of the particle on the image is spread by the point spread function of the camera lens. Therefore we can model the mapped particle trajectory as a convolution of the resting particle with its trajectory. Here we model the particle trajectory as a two-dimensional, ^symmetric Gaussian junction convolved with a Bezier curve as an approximation of the trajectory with the pixel aperture of the camera. We assume that the velocity of the particle is constant over the measurement period. We will show that the particle trajectory can be reconstructed up to sub-pixel accuracy. This is verified with synthetic particle trajectories and qualitative comparisons with real world measurements.
机译:我们提出了一种从粒子条纹测速法重建弯曲粒子轨迹的方法。粒子的反射特性被建模为点光源。颗粒在图像上的映射通过相机镜头的点扩展功能扩展。因此,我们可以将映射的粒子轨迹建模为静止粒子与其轨迹的卷积。在这里,我们将粒子轨迹建模为二维,对称的高斯结,并与Bezier曲线卷积,该轨迹作为轨迹与相机像素孔径的近似值。我们假设粒子的速度在整个测量期间是恒定的。我们将展示粒子轨迹可以重构到亚像素精度。这已通过合成粒子轨迹以及与真实世界测量的定性比较得到了验证。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号