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InSb, GaSb, and GaInSb Grown Using Trisdimethylaminoantimony

机译:使用三二甲基氨基锑生长的InSb,GaSb和GaInSb

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GaInSb alloys as well as the constituent binaries InSb and GaSb have been grown by organometallic vapor phase epitaxy using the new antimony precursor trisdimethylaminoantimony (TDMASb) combined with conventional group Ⅲ precursors trimethylindium (TMIn) and trimethylgallium (TMGa). InSb layers were grown at temperatures between 275 and 425℃. The low values of Ⅴ/Ⅲ ratio required to obtain good morphologies at the lowest temperatures indicate that the pyrolysis temperature is low for TDMASb. In fact, at the lowest temperatures, the InSb growth efficiency is higher than for other antimony precursors, indicating the TDMASb pyrolysis products assist with TMIn pyrolysis. A similar, but less pronounced trend is observed for GaSb growth at temperatures of less than 500℃. No excess carbon contamination is observed for either the InSb or GaSb layers. Ga_(1-x)In_xSb layers with excellent morphologies with values of x between 0 and 0.5 were grown on GaSb substrates without the use of graded layers. The growth temperature was 525℃ and the values of Ⅴ/Ⅲ ratio, optimized for each value of x, ranged between 1.25 and 1.38. Strong photoluminescence (PL) was observed for values of x of less than 0.3, with values of halfwidth ranging from 13 to 16 meV, somewhat smaller than previous reports for layers grown using conventional precursors without the use of graded layers at the interface. The PL intensity was observed to decrease significantly for higher values of x. The PL peak energies were found to track the band gap energy; thus, the luminescence is due to band edge processes. The layers were all p-type with carrier concentrations of approximately 10~(17) cm~(-3). Transmission electron diffraction studies indicate that the Ga_(0.5)In_(0.5)Sb layers are ordered. Two variants of the Cu-Pt structure are observed with nearly the same diffracted intensities. This is the first report of ordering in GalnSb alloys.
机译:GaInSb合金以及组成的二元InSb和GaSb已通过有机金属气相外延生长,方法是使用新型的锑前体三二甲基氨基锑(TDMASb)结合常规的Ⅲ族前体三甲基铟(TMIn)和三甲基镓(TMGa)。 InSb层在275至425℃的温度下生长。在最低温度下获得良好形态所需的低Ⅴ/Ⅲ比值表明TDMASb的热解温度较低。实际上,在最低温度下,InSb的生长效率要高于其他锑前体,表明TDMASb热解产物有助于TMIn热解。在低于500℃的温度下,GaSb的生长有相似但不太明显的趋势。 InSb或GaSb层均未观察到过量的碳污染。在不使用渐变层的情况下,在GaSb衬底上生长出具有极佳形貌,x值介于0和0.5之间的Ga_(1-x)In_xSb层。生长温度为525℃,针对每个x值优化的​​Ⅴ/Ⅲ比值在1.25和1.38之间。 x的值小于0.3时观察到强光致发光(PL),半宽度的值在13至16 meV之间,这比以前报道的使用常规前体生长而在界面处不使用渐变层的层小。对于较高的x值,观察到PL强度显着降低。发现PL峰值能量跟踪带隙能量。因此,发光是由于带边缘过程。这些层都是p型的,载流子浓度约为10-(17)cm-(-3)。透射电子衍射研究表明,Ga_(0.5)In_(0.5)Sb层是有序的。观察到Cu-Pt结构的两个变体具有几乎相同的衍射强度。这是GalnSb合金订购的第一份报告。

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