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A Study on a Surface Preparation Method for Single-Crystal SiC Using an Fe Catalyst

机译:铁催化剂制备单晶SiC表面的方法研究

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In this study we investigated the possibility of removing and flattening a single-crystal silicon carbide (SiC) surface by a novel polishing method utilizing hydroxyl radicals (OH radicals) generated on an Fe catalyst surface. To demonstrate the feasibility of preparing a smooth SiC surface, an Fe catalyst and a SiC substrate were rubbed together in H2O2 solution, and then the area on the SiC surface that had come into contact with the Fe catalyst was observed in detail. The removal depth and surface microroughness were measured and evaluated using a phase-shift interference microscope and an atomic force microscope (AFM), respectively. Moreover, the removal of material from the SiC surface by utilizing an Fe catalyst rod was examined. The obtained results show that the hard SiC surface can be effectively polished and that the processed area on the SiC surface has atomic-level smoothness along the sliding direction. Moreover, it is shown that the removal characteristics of the SiC substrate depend on process parameters such as the process time, rotation speed, contact load, and concentration of H2O2 solution. These results provide useful information for preparing an atomically smooth SiC surface.
机译:在这项研究中,我们研究了通过一种新颖的抛光方法,利用在Fe催化剂表面产生的羟基自由基(OH自由基)来去除和平坦化单晶碳化硅(SiC)表面的可能性。为了证明制备光滑SiC表面的可行性,将Fe催化剂和SiC衬底在H 2 O 2 溶液中摩擦在一起,然后在SiC表面上进行摩擦详细观察到与Fe催化剂接触的产物。分别使用相移干涉显微镜和原子力显微镜(AFM)测量和评估去除深度和表面微粗糙度。此外,研究了利用Fe催化剂棒从SiC表面去除材料。所得结果表明,可以有效地抛光硬质SiC表面,并且该SiC表面上的加工区域沿滑动方向具有原子级的光滑度。此外,表明SiC衬底的去除特性取决于诸如工艺时间,转速,接触负载和H 2 O 2 的浓度的工艺参数。解。这些结果为制备原子上光滑的SiC表面提供了有用的信息。

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