首页> 外文期刊>Journal of Crystal Growth >Structural, optical and electrical properties of polycrystalline pyrite (FeS_2) films obtained by thermal sulfuration of iron films
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Structural, optical and electrical properties of polycrystalline pyrite (FeS_2) films obtained by thermal sulfuration of iron films

机译:通过铁膜热硫化获得的多晶黄铁矿(FeS_2)膜的结构,光学和电学性质

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Iron films deposited by magnetron sputtering were annealed in 80 kPa sulfur vapor at 673 and 773 K for different times. The structural, optical and electrical properties were determined. Pyrite particles formed at 673 K reveal an aggregate morphology evolved from some transitional iron sulfides. With increasing annealing time, the crystallites become distinguishable and the aggregate morphology tends to disappear. The pyrite grains formed at 773 K have more uniform distribution and show more obvious propagation with annealing time than those formed at 673 K. The values of electrical resistivity of the films prepared at both temperatures and optical absorption edge of the film prepared at 673 K significantly increase with annealing time. The films prepared at 673 K generally have higher optical absorption edges, lower electrical resistivity, higher carrier concentration and lower charge mobility than those prepared at 773 K. Film bulk integrity, residual iron amount and grain boundary area could be considered as the factors responsible for the film property changed with annealing temperature and time.
机译:通过磁控溅射沉积的铁膜在80 kPa的硫蒸气中于673和773 K退火不同的时间。确定了结构,光学和电学性质。在673 K处形成的黄铁矿颗粒显示出一些过渡性硫化铁形成的聚集体形态。随着退火时间的增加,微晶变得可分辨,并且聚集体形态趋于消失。在673 K处形成的黄铁矿晶粒比在673 K处形成的黄铁矿晶粒具有更均匀的分布,并且在退火时间下表现出更明显的传播。在673 K处制备的薄膜的温度和光吸收边缘的电阻率值均显着随着退火时间的增加。与在773 K下制备的薄膜相比,在673 K下制备的薄膜通常具有更高的光吸收边缘,更低的电阻率,更高的载流子浓度和更低的电荷迁移率。薄膜的整体完整性,残余铁量和晶界面积可被认为是造成该现象的因素薄膜的性能随退火温度和时间的变化而变化。

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