Dependence of the surface resistance on the microdefects in YBa_2Cu_3O_7-x films

摘要

Dependence of the surface resistance on the microdefects in YBa_2Cu_3O_7-x high-temperature superconducting thin films deposited on MgO substrates was investigated. The surface resistance was measured by using a dielectric rsonant method. The kmicrodefects were charactrized by X-ray diffraction, transmission electron microscopy and scanning electron microscopy. Stacking fualt is a dominant factor in determining the surface resistance when the full-width at half-maximum (FWHM) of (0 0 6) YBCO peak of the 0-20 scan is above 0.5 deg. Grain boundary is dominant when the FWHM is below 0.5 deg.