Special Issue on Reverse Engineering and Computational Metrology: Part 1—Surface Reconstruction Methods

摘要

Computational metrology has recently begun to play a prominent role in the evolution of engineering systems and the improvement of production technologies. Indeed, this field has become essential due to the use of advanced inspection technologies in manufacturing industries. These technologies, primarily emerging scanning technologies such as coordinate measuring machines (CMMs), laser scanners, and three-dimensional cameras, have led to industrial demands for digital geometric processing (DGP) of sampled data. In response, new methodologies have been developed to cope with the complex metrology problems of registration, data fusion, surface reconstruction, and handling tolerances of the sampled data. These computational metrology methods are used mainly for design, manufacturing, inspection, and quality control applications.