A Method for Calculating Fractal Dimension of Amicrons and Fractal Simulation of Boundary Micro-Topography

摘要

A simple and practical method to calculate the fractal dimension (FD) of amicron's projective surface profile based on fractal theory is proposed. Taking Al(OH)_3 material particles as an example, the scanning electron microscope (SEM) photos of particles were processed using an image-processing software (IPS) Photoshop. Taking the pixel as a fixed yardstick with the enlargement of the size of the particle image, the box-dimension and circumference-area (C-S) methods were used to calculate the FD of the surface profile of the particle. The FD of 1.2623 of the classic Koch curve is obtained, which approximates the true value of 1.2628. The complexities of the object's boundary and surface micro-topography are simulated successfully by a generator method.