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首页> 外文期刊>Journal of Applied Physics >Measurement of the Transmission Spectra of 1‐MeV Electrons with Normal Incidence on Aluminum Slabs
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Measurement of the Transmission Spectra of 1‐MeV Electrons with Normal Incidence on Aluminum Slabs

机译:铝板上具有正常入射角的1 MeV电子的透射谱的测量

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摘要

Measurements of transmission energy spectra of 1‐MeV electrons with normal incidence on aluminum slabs have been made as a function of transmission angle. Slabs of thicknesses 0.11, 0.22, and 0.33 g/cm2, equivalent to 0.2, 0.4, and 0.6, the range of 1‐MeV electrons in aluminum, were used. The electron spectra were obtained with lithium‐ion‐drift silicon detectors. The experimental results have been compared to calculated results obtained by use of Monte Carlo techniques. These data were found to agree except at the transmission angles less than 30 deg for the 0.11‐g/cm2 slab.
机译:垂直于铝板上入射的1-MeV电子的传输能谱已根据传输角进行了测量。使用厚度分别为0.11、0.22和0.33 g / cm2的平板,分别相当于铝中1-MeV电子的范围0.2、0.4和0.6。电子光谱是使用锂离子漂移硅探测器获得的。实验结果已与使用蒙特卡洛技术获得的计算结果进行了比较。发现这些数据是一致的,除了在0.11 g / cm2平板的透射角小于30度时。

著录项

  • 来源
    《Journal of Applied Physics 》 |1966年第4期| 共5页
  • 作者单位

    LTV Research Center, Ling‐Temco‐Vought, Inc., Dallas, Texas;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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