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Surface and Bulk Conductivities of Cu2O Single Crystals

机译:Cu2O单晶的表面和体积电导率

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摘要

The surface and bulk conductivities of Cu2O crystals were measured using guard ring techniques on cleaved, polished and etched samples over a temperature range from +200°C to -170°C in air, vacuum, and helium atmosphere. The bulk conductivity followed the simple exponential temperature dependence of the typical semiconductor with a single activation energy of about 0.3 eV over the entire range. The temperature dependence of the surface conductivity appeared to consist of a number of activation energies, ranging from 0.1 to 0.3 eV. Heating to 180°C in air or vacuum can be used to minimize the surface contribution to the conductivity. It was found that polished surfaces are highly deceptive for standard measurements of transport effects.
机译:使用保护环技术在温度,温度范围为+ 200°C至-170°C的空气,真空和氦气环境中,对劈裂,抛光和蚀刻后的样品测量了Cu2O晶体的表面和整体电导率。整体电导率遵循典型半导体的简单指数温度依赖性,在整个范围内具有约0.3 eV的单个激活能。表面电导率的温度依赖性似乎由许多活化能组成,范围从0.1到0.3 eV。可以在空气或真空中加热到180°C,以最小化表面对电导率的影响。发现抛光表面对于传输效应的标准测量具有很高的欺骗性。

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  • 来源
    《Journal of Applied Physics 》 |1970年第1期| 共9页
  • 作者

    Kuzel R.; Weichman F. L.;

  • 作者单位

    Department of Physics, University of Alberta, Edmonton, Alberta, Canada;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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