Theoretical Method for Determining the Thickness and Surface Scattering Coefficient of Metal Films

Fitzgerald P. E.; Leonard W. F.

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Theoretical Method for Determining the Thickness and Surface Scattering Coefficient of Metal Films

机译：确定金属膜厚度和表面散射系数的理论方法

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摘要

A method to determine the thickness and surface scattering coefficient of metal films from Hall‐effect and temperature coefficient of resistance measurements is described. The method is based on the Fuchs‐Sondheimer theory for size effects.

机译：描述了一种通过霍尔效应和电阻温度系数确定金属膜厚度和表面散射系数的方法。该方法基于Fuchs-Sondheimer理论的尺寸效应。

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来源
《Journal of Applied Physics》 |1971年第7期|共2页
作者
Fitzgerald P. E.; Leonard W. F.;
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作者单位

Electronic Sciences Center, Southern Methodist University, Dallas, Texas 75222;

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收录信息美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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正文语种 eng
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Theoretical Method for Determining the Thickness and Surface Scattering Coefficient of Metal Films

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