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X‐ray‐induced electron emission from metals

机译:X射线诱导的金属电子发射

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Energy and angular distributions of electrons (energies greater than 5 keV) emitted from metals irradiated by photons in the x‐ray energy range were measured with a lithium‐drifted silicon detector. The data presented here characterize electron emission distributions for normal photon incidence. They provide a systematic set of absolute distributions for quantitative comparisons to theoretical treatments of the combined photon and electron transport process. X‐ray bremsstrahlung spectra with mean photon energies of 30 and 54 keV were used to induce electron emission from aluminum, copper, silver, and tantalum. Angular distributions for the higher‐Z materials are found to be nearly cosine distributions in both the forward and backward emission directions, while the distributions for lower‐Z materials deviate from a cosine distribution, tending to be more isotropic. Energy distributions are observed to change very little as a function of emission angle. Energy and angular distributions calculated by Monte Carlo and analytic techniques show good correlation with the measured distributions. Calculated forward and back (2π) emission efficiencies agree with experimental values within the uncertainties of these quantities (±15 to 20%). The generally good agreement between the experimental and theoretical results establishes the validity of the present techniques for calculating high‐energy (greater than 5 keV) x‐ray‐induced electron emission from metals.
机译:用锂漂移硅探测器测量了在x射线能量范围内由光子辐射的金属发出的电子的能量和角分布(能量大于5 keV)。此处提供的数据描述了正常光子入射的电子发射分布。他们提供了一套系统的绝对分布,用于定量比较光子和电子传输过程的理论处理。具有30和54 keV平均光子能量的X射线致辐射光谱用于诱导铝,铜,银和钽的电子发射。发现高Z材料的角度分布在向前和向后的发射方向上几乎都是余弦分布,而低Z材料的分布则偏离余弦分布,趋向于各向同性。观察到能量分布随发射角的变化很小。通过蒙特卡洛和分析技术计算出的能量和角度分布与测得的分布显示出良好的相关性。在这些量的不确定性范围内(±15至20%),计算的正向和反向(2π)发射效率与实验值一致。实验结果和理论结果之间的总体良好一致性确立了本技术用于计算金属的高能(大于5 keV)x射线诱导的电子发射的有效性。

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    《Journal of Applied Physics 》 |1975年第6期| P.2456-2463| 共8页
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  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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