Microstructure of tellurium films

摘要

Growth and structure of tellurium films deposited by molecular beam technique onto NaCl single‐crystal and glass substrates were studied by TEM. It was observed that films deposited onto NaCl substrate have a structure similar to those obtained by other workers. The films deposited on glass at a substrate temperature of 150 °C have an altogether different structure showing a definite c‐axis orientation with needle‐shaped crystallites lying parallel to the substrate plane.