Dielectric behavior of MgO:Li+ crystals

摘要

Measurements of the dielectric constant in crystals of MgO doped with Li+ ions have been carried out after quenching from anneals at 1300 °C in static air. Prior to heat treatment, the crystals showed no discernible dielectric loss, but afterwards, the loss tangent exceeded 0.4. For 10‐min anneals, the dielectric relaxation is very close to a Debye process, and the temperature dependence of the maximum of the loss peak corresponds to an activation energy of 0.724 eV. When plotted in the form of a Cole‐Cole arc, the data indicate that deviation from a Debye relaxation amounts to a distribution of relaxation time no greater than that which can be accounted for with a distribution of activation energies of only 0.007 eV. For longer heating times, overlapping relaxation processes appear. The lack of broadening of the loss peak, and the magnitude of the relaxation time, yield clues as to possible loss mechanisms.