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Growth rate dependence of rare‐earth segregation in the liquid‐phase epitaxy of magnetic garnet films

机译:磁性石榴石薄膜液相外延中稀土偏析的生长速率依赖性

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Epitaxial films of the archetypical bubble garnet (R, Y)3Fe5O12, where R is a rare earth, were grown on (111) Gd3Ga5O12 substrates from a 200:1 by weight PbO:B2O3 flux using the horizontal dipping technique with rotation. Growth rate was varied by adjusting supercooling and rotation rate, and the equilibrium segregation coefficients of the dodecahedrally crystallizing cations KR = Rxtal/Rmelt were determined with reference to the film‐lattice constant and the segregation of these cations on octahedral sites. KR was found to obey the growth model of Burton, Prim, and Slichter [J. Chem. Phys. 21, 1987 (1953)], KR = KR0/[KR0+(1-KR0)e-kf], where f is the growth rate, KR0 is the segregation coefficient at zero growth rate, and k is a parameter which is a function of the thickness of the growth interface and the diffusion constant. The parameter k was found to be independent of the species R and to have the value 1.18 sec μm-1 for the particular growth condition. A strong correlation was found between KR0 and the partial molar heat of mixing of the R2O3 oxide and the flux, as calculated from regular solution theory [D. M. Gualtieri, J. Appl. Phys. 50, 2170 (1979)].
机译:使用旋转旋转的水平浸渍技术,从200:1重量的PbO:B2O3助熔剂在(111)Gd3Ga5O12衬底上生长原型气泡石榴石(R,Y)3Fe5O12的外延膜,其中R为稀土。通过调节过冷和旋转速度来改变生长速率,并参考薄膜晶格常数和这些阳离子在八面体位点上的偏析来确定十二面体结晶阳离子的平衡偏析系数KR = Rxtal / Rmelt。发现KR服从Burton,Prim和Slichter的生长模型[J.化学物理21,1987(1953)],KR = KR0 / [KR0 +(1-KR0)e-kf],其中f是增长率,KR0是零增长率下的偏析系数,k是作为函数的参数生长界面的厚度和扩散常数的关系。发现参数k与物种R无关,并且对于特定的生长条件具有参数1.18 secμm-1。根据常规溶液理论[D.]计算,发现KR0与R2O3氧化物和助熔剂混合的部分摩尔热之间有很强的相关性。 M.Gualtieri,J.Appl。物理50,2170(1979)]。

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    《Journal of Applied Physics》 |1982年第3期|P.2489-2491|共3页
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  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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