Enhanced energy deposition in a thin anode relativistic electron beam diode determined by Kα emission

摘要

The reflexing motion of electrons in the pinch region of a relativistic electron beam diode is studied using Kα x‐ray emission from the anode as a diagnostic. In reference experiments reflexing is suppressed by using multilayered targets and Monte Carlo simulations are used to correct for backscattering. An enhancement factor of about 1.7 in the energy deposition relative to the single‐pass case is found in the particular diode studied.