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首页> 外文期刊>Journal of Applied Physics >Argon metastable and resonant level densities in Ar and Ar/Cl_2 discharges used for the processing of bulk niobium
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Argon metastable and resonant level densities in Ar and Ar/Cl_2 discharges used for the processing of bulk niobium

机译:用于处理大块铌的Ar和Ar / Cl_2放电中的氩亚稳态和共振能级密度

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摘要

A comparative analysis of two popular spectroscopy techniques is conducted in a coaxial cylindrical capacitively coupled discharge designed for the plasma processing of superconducting radio frequency (SRF) cavities. The density of the metastable and resonant levels in Ar is measured in both Ar and Ar/Cl2 discharges to properly characterize the unique discharge system and aid in the development of a cavity etching routine. The first method, deemed the "branching fraction method," utilizes the sensitivity of photon reabsorption of radiative decay to measure the lower state (metastable and resonant) densities by taking ratios of spectral lines with a common upper level. This method has been gaining popularity as it does not require any a priori knowledge about the electron energy distribution. The second method is a tunable diode laser absorption spectroscopy technique that measures the thermal Doppler broadening of spectral lines, from which the neutral gas temperature and lower state density of the transition can be evaluated. The two methods were conducted in tandem, while external parameters that were empirically determined to be important to the etching mechanism of SRF cavities are varied. Relationships between the excited state densities and the external parameters are presented for both spectroscopy methods and conclusions about the effects of these parameters on the discharge are stated when appropriate.
机译:在为超导射频(SRF)腔的等离子体处理而设计的同轴圆柱电容耦合放电中,对两种流行的光谱技术进行了比较分析。在Ar和Ar / Cl2放电中都测量了Ar中亚稳态和共振能级的密度,以正确表征独特的放电系统并帮助开发腔体蚀刻程序。第一种方法被认为是“分支分数法”,它利用光子重吸收辐射衰变的灵敏度,通过取具有共同上位能级的谱线之比来测量较低态(可转移和共振)的密度。由于该方法不需要关于电子能量分布的任何先验知识,因此已得到普及。第二种方法是可调谐二极管激光吸收光谱技术,该技术测量光谱线的热多普勒展宽,从中可以评估中性气体温度和过渡态的较低态密度。两种方法是串联进行的,而根据经验确定对SRF腔的腐蚀机理很重要的外部参数却有所不同。两种光谱方法都给出了激发态密度和外部参数之间的关系,并在适当的时候陈述了这些参数对放电的影响的结论。

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