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首页> 外文期刊>Journal of Applied Physics >Microsecond Measurement of the Phosphorescence of X‐Ray Fluorescent Screens
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Microsecond Measurement of the Phosphorescence of X‐Ray Fluorescent Screens

机译:微秒测量X射线荧光屏的磷光

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摘要

Microsecond square‐wave x‐ray pulses, repeated a thousand times a second, were obtained by operating an x‐ray tube directly from a radar pulser. The phosphorescent build‐up and decay of light emitted by fluorescent materials when irradiated by the x‐ray pulses was observed with a multiplier phototube connected to an oscilloscope. Oscillograms of CaWO4 (radiographic intensifying screen) and BaSO4 indicate simple exponential response, with decay to 1/eth intensity in 6 and 0.8 microseconds, respectively. MgWO4 and Patterson B (fluoroscopic) and D (photofluorographic) screens were found to complete their main response to microsecond excitation in 10 to 100 microseconds, but their decay is not exponential.
机译:通过直接从雷达脉冲发生器操作X射线管获得了每秒重复千次的微秒方波X射线脉冲。当倍增光电管连接到示波器时,观察到了x射线脉冲照射时荧光材料发出的光的磷光积累和衰减。 CaWO4(放射增强屏)和BaSO4的波形图表明简单的指数响应,分别在6和0.8微秒内衰减到1 / eth强度。发现MgWO4和Patterson B(荧光镜)和D(荧光照相)屏幕在10到100微秒内完成了对微秒激发的主要响应,但衰减不是指数级的。

著录项

  • 来源
    《Journal of Applied Physics》 |1947年第6期|共7页
  • 作者

    Marshall Fitzamp;

  • 作者单位

    Westinghouse Research Laboratory, East Pittsburgh, Pennsylvania;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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