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Verification of a model for the piezoelectric d_(33) coefficient of cellular electret films

机译:蜂窝驻极体膜压电d_(33)系数模型的验证

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摘要

An existing model for the piezoelectric thickness coefficient (d_(33) coefficient) of cellular polymers is tested with experimental data obtained from two differently manufactured cellular polypropylene (PP) materials. The model assumes the cellular film to consist of plane parallel solid and gaseous layers charged at their interfaces. The cellular PP films are expanded by a pressure treatment. Subsequently, due to viscoelastic relaxation, the thickness of the films decreases, thus causing a change of their Young's modulus Y with time. The values of Y are obtained from interferometric measurements of the resonance frequency of the films. Together with the measured thickness of the solid layers and air layers in the material, the d_(33) coefficients can be determined from the model. These values are compared with experimental results for d_(33) also obtained interferometrically by means of the inverse piezoelectric effect. A very good agreement between the measured and calculated d_(33) coefficients as a function of film thickness is obtained for all investigated films.
机译:利用从两种不同制造的多孔聚丙烯(PP)材料获得的实验数据,测试了多孔聚合物压电厚度系数(d_(33)系数)的现有模型。该模型假设细胞膜由在其界面处带电的平面平行固体和气体层组成。多孔PP膜通过压力处理而膨胀。随后,由于粘弹性松弛,膜的厚度减小,从而导致其杨氏模量Y随时间变化。 Y的值是从膜的共振频率的干涉测量获得的。连同测量的材料中固体层和空气层的厚度,可以从模型中确定d_(33)系数。将这些值与d_(33)的实验结果进行比较,d_(33)也通过逆压电效应通过干涉法获得。对于所有研究的薄膜,在实测和计算的d_(33)系数之间均具有很好的一致性,该系数是薄膜厚度的函数。

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