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首页> 外文期刊>Journal of Applied Physics >Co-rich cobalt platinum nanowire arrays: Effects of annealing
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Co-rich cobalt platinum nanowire arrays: Effects of annealing

机译:富钴钴铂纳米线阵列:退火的影响

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The effects of annealing on the crystal structure and magnetic properties of Co-rich cobalt platinum nanowire arrays embedded in anodic aluminium oxide membranes have been investigated. For this purpose, a rapid thermal annealing to temperatures of 300℃ to 800℃ has been used. Transmission electron microscopy and scanning electron microscopy show that the nanowires have a mean diameter of 14 nm and an estimated wire density of 7.8 X 10~(10) cm~(-2). From x-ray diffraction patterns, we find that the nanowires are hcp and possess a preferred texture in which the c axis of the grains tends to lie along the major axis of the wire. Vibrating sample magnetometry measurements indicate that the easy axis is along the nanowire axis direction. Hysteresis loops, saturation magnetization, squareness ratio (M_r/M_s), and coercivity (perpendicular and parallel to the nanowire axis) have all been investigated as a function of the annealing temperature (T_A). Coercivity parallel to the wire axis first increases with T_A, attains a maximum at 600℃ (which is 150% of the as-deposited sample), and then decreases. By contrast there is relatively little change in the coercivity measured perpendicular to the wires. The saturation magnetization for the as-deposited sample is 1360 emu/cc and remains almost constant for annealing temperatures up to 500℃: for T_A > 500℃ it decreases significantly. The maximum (M_r/M_s) ratio attained in this study is 0.99, the highest value reported thus far for cobalt platinum alloy nanowires. The data suggest that these materials are potential candidates for high-density magnetic recording media.
机译:研究了退火对嵌入阳极氧化铝膜中的富钴钴铂纳米线阵列的晶体结构和磁性的影响。为此目的,已经使用了快速热退火至300℃至800℃的温度。透射电子显微镜和扫描电子显微镜表明,纳米线的平均直径为14 nm,估计的线密度为7.8 X 10〜(10)cm〜(-2)。从X射线衍射图中,我们发现纳米线是hcp并具有优选的织构,其中晶粒的c轴倾向于沿着线的主轴线。振动样品的磁力测量表明,易轴沿纳米线轴方向。磁滞回线,饱和磁化强度,矩形比(M_r / M_s)和矫顽力(垂直且平行于纳米线轴)已作为退火温度(T_A)的函数进行了研究。平行于线轴的矫顽力首先随着T_A的增加而增加,在600℃时达到最大值(是沉积样品的150%),然后降低。相反,垂直于导线测得的矫顽力变化相对较小。沉积样品的饱和磁化强度为1360 emu / cc,在最高500℃的退火温度下几乎保持恒定:当T_A> 500℃时,饱和磁化强度显着降低。这项研究中获得的最大(M_r / M_s)比为0.99,是迄今为止报道的钴铂合金纳米线的最高值。数据表明这些材料是高密度磁记录介质的潜在候选材料。

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