A method for measuring exchange stiffness in ferromagnetic films

摘要

An exchange stiffness, A_(ex), in ferromagnetic films is obtained by fitting the M(H) dependence of two ferromagnetic layers antiferromagnetically coupled across a nonmagnetic spacer layer with a simple micromagnetic model. In epitaxial and textured structures this method allows measuring A_(ex) between the crystallographic planes perpendicular to the growth direction of ferromagnetic films. Our results show that A_(ex) between [0001] planes in textured Co grains is 1.54 ± 0.12 × 10~(-11) J/m.