Qualitative and quantitative evaluation of thin-film solar cells using solar cell local characterization

摘要

The light-beam-induced current-based CELLO measurement technique (solar CEL1 LOcal characterization), originally developed for wafer-based silicon solar cells, can successfully be applied to thin-film solar cells, provided that contacting of a single cell is possible. This is shown exemplarily for several crystalline silicon on glass samples, having varying quality with respect to photocurrent extraction, series resistance, and power losses. For the latter, a comparison with results obtained from dark lock-in fhermography gives quantitative agreement, provided that the cells are not severely shunted.