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机译:硅沟道自旋累积器件中观测到的Hanle效应信号的分析
Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Japan,Department of Physical Electronics, Tokyo Institute of Technology, 2-12-1, Ookayama, Meguro-ku, Tokyo 152-8552, Japan;
Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Japan;
Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Japan;
Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Japan;
Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Japan;
Imaging Science and Engineering Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 226-8503, Japan;
机译:铁磁体/半导体横向自旋阀装置中局部自旋累积信号的非单调偏置依赖性
机译:局部旋转信号的非单调偏置依赖性在铁磁性/半导体横向旋转阀装置中的局部自旋累积信号
机译:局部旋转信号的非单调偏置依赖性在铁磁性/半导体横向旋转阀装置中的局部自旋累积信号
机译:具有巨大自旋累积的Si非本地传输设备中的自旋信号
机译:批量CMOS反相和累加器件的性能分析和扩展机会。
机译:铁磁谐振动态检测铁磁半导体器件中电子自旋积累
机译:Si沟道旋转累积装置观察到的Hanle效应信号分析