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Study of CoFeB thickness and composition dependence in a modified CoFeB/MgO/CoFeB perpendicular magnetic tunnel junction

机译:改进的CoFeB / MgO / CoFeB垂直磁隧道结中CoFeB厚度和成分依赖性的研究

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摘要

We studied the CoFeB thickness and composition dependence of tunneling magnetoresistance (TMR) and resistance-area product (RA) in a modified CoFeB/MgO/CoFeB perpendicular magnetic tunnel junction (MTJ), in which the bottom CoFeB is coupled to an in-plane exchange biased magnetic layer. This stack structure allows us to measure TMR and RA of the MTJs in sheet film format without patterning them, using current-in-plane-tunneling (CIPT) technique. The thickness ranges for both top and bottom CoFeB to exhibit perpendicular magnetic anisotropy are similar to what are seen in each single magnetic film stack. However, CIPT measurement revealed that there exists an optimal thickness for both top and bottom CoFeB to achieve the highest TMR value. Magnetic hysteresis loops also suggest the thickness-dependent coupling between the top and bottom CoFeB layers. We studied MTJs with two CoFeB compositions (Co_(40)Fe_(40)B_(20) and Co_(20)Fe_(60)B_(20)) and found that Co_(20)Fe_(60)B_(20) MTJs give higher TMR and also wider perpendicular thickness range when used at the top layer.
机译:我们研究了改进的CoFeB / MgO / CoFeB垂直磁性隧道结(MTJ)中的CoFeB厚度和隧穿磁阻(TMR)和电阻面积积(RA)的成分依赖性,其中底部CoFeB耦合至面内交换偏磁层。这种堆叠结构使我们能够使用平面电流隧道(CIPT)技术以片状胶片格式测量MTJ的TMR和RA,而无需对其进行构图。顶部和底部CoFeB的厚度范围均表现出垂直的磁各向异性,类似于在每个单个磁性膜叠层中看到的厚度范围。但是,CIPT测量表明,顶部和底部CoFeB均存在最佳厚度,以实现最高TMR值。磁滞回线还暗示了顶层和底层CoFeB层之间的厚度相关耦合。我们研究了具有两种CoFeB成分(Co_(40)Fe_(40)B_(20)和Co_(20)Fe_(60)B_(20))的MTJ,发现Co_(20)Fe_(60)B_(20)MTJ当用于顶层时,可提供更高的TMR以及更宽的垂直厚度范围。

著录项

  • 来源
    《Journal of Applied Physics》 |2016年第7期|073907.1-073907.6|共6页
  • 作者单位

    Colleges of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, New York 12203, USA;

    Colleges of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, New York 12203, USA;

    Colleges of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, New York 12203, USA;

    Colleges of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, New York 12203, USA;

    Colleges of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, New York 12203, USA;

    Colleges of Nanoscale Science and Engineering, SUNY Polytechnic Institute, Albany, New York 12203, USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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